Chroma ATE

PHOTONICS DEVICE MAPPING PROBE TESTER

Chroma 58212-C is an automated Epitaxial Wafer/Chip probe test system with precision temperature-control that provides fast and accurate optoelectronic performance measurements and multi-site tests for a wide range of Laser Diode and Light-Emitting Diode (LED) product applications. The 58212-C probe tester features a flexible design that provides testing for different types of optoelectronic components, including Lateral, Vertical, and Flip Chip. The pretest scan program provides complete wafer mapping to ensure test accuracy, while our patented probe tip prevents scratching of the DUT and ensures that every chip contact is made properly. Chroma 58212-C's customized multi-site design supports testing multiple locations in a single probe, stabilizes the test, saves test time and increases test performance. At the same time, optical data such as forward current, forward voltage, leakage current, reverse breakdown voltage, slope efficiency, and photoelectric conversion efficiency can be obtained all in one single probe. The 58212-C's software interface and advanced logic algorithms significantly improve production efficiency. Comprehensive test reports and yield statistics allow users to easily get a handle on production.

KEY FEATURES

• High-speed and high-precision testing
• Supports lateral, vertical and flip-chip

 Configurations:

• Up to 8 inch wafers
• Wide range of electrical tests (LD or LED)
• Accurate and fast alignment scanning

 Process:

• Multi-site test functionality
• Auto load/unload

Measurement Items

Electrical measurements:

• Threshold Current (Ith)
• Forward Voltage (Vf)
• Reverse Leakage Current (Ir)
• Reverse Breakdown Voltage (Vbr)

Optical measurements:

• Optical Power
• Centre Wavelength (Wc)
• Peak Wavelength (Wp)
• Full Width at Half Maximum (FWHM)

Hardware

• Automated LED wafer/chip prober
• Electical test module
• Optical test module
• Optional ESD test module (LED application)