Chroma ATE

Advanced SoC Test System

Semiconductor manufacturing is a fast-moving industry. Devices today are highly integrated, with multiple functions incorporated into a single piece of silicon. Consequently, capital equipment must be designed to outlive several device generations. Chroma's SoC Test System, the 3680, provides flexible configurations and a wide range of coverage, enabling you to test various device types on a single platform. Thus, protecting your investment. The system supports configurations up to 2048 pins within 24 universal slots, with digital performance up to 1Gbps, up to 256MW default vector memory, and ±150ps EPA for superior timing accuracy in high-speed applications. Various application-specific options are available such as HDADDA2 for converter test, HDVI for high-voltage and automotive, and HDAVO for high-performance mixed-signal, including video applications (400Msps AWG & 250Msps DIG) and high-precision audio applications (24-bit AWG & DIG). Additionally, HCDPS offers high current capability up to 32A per channel, and HDRF2 provides RF testing functionality featuring 32 ports and 4 VST. The 3680 also includes a mainframe cabinet containing an AC/DC power distribution unit and system power supply. An optional testhead manipulator is offered for docking with automated device-handling equipment. The system is specifically designed for highthroughput and high parallel testing capability to provide the best solution for fabless, IDM and testing houses. With comprehensive test capability, high accuracy, powerful software, and excellent reliability, the 3680 is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.

APPLICATIONS

• Radio frequency (RF)
• Internet of Things (IoT)
• Artificial Intelligence (AI)
• Microcontroller Unit (MCU)
• Digital Audio
• Digital TV (DTV)
• Set Top Box (STB)
• Digital Signal Processing (DSP)
• Network Processor and Field Programmable Gate Array (FPGA)

KEY FEATURES

• 24 interchangeable slots for digital, analog and mixed-signal applications
• Data rate up to 1Gbps
• Up to 2048 sites parallel test
• Up to 2048 digital I/O pins
• 256 MW vector memory (512 MW option) (X2 mode)
• Up to 64 CH PMU for high precision measurement
• Per-pin timing measurement unit/PPMU/ frequency measurement
• SCAN up to 64 chains/16G depth
• Edge placement accuracy (EPA): ±150ps
• Up to 128 CH high density DPS32
• High density HDADDA2 mixed-signal option
• Efficient high power HCDPS analog option
• High performance HDAVO option
• High density HDVI analog option
• High density HDRF2 option
• Direct probing system*
• Multi-time domain function*
• Microsoft Windows® 10 OS
• C#.NET and GUI programming interface
• CRISPro, full suite of intuitive software tools
• Test program and pattern converters for other platforms
• Accept PIB and probe card of other testers directly
• Support STDF data output and customized data format
• Air-cooled, small footprint tester-in-a-test-head design